DocumentCode
1104333
Title
2D Affine-Invariant Contour Matching Using B-Spline Model
Author
Wang, Yue ; Teoh, Eam Khwang
Author_Institution
Nanyang Technol. Univ., Singapore
Volume
29
Issue
10
fYear
2007
Firstpage
1853
Lastpage
1858
Abstract
This paper presents a new affine-invariant matching algorithm based on B-spline modeling, which solves the problem of the nonuniqueness of B-spline in curve matching. This method first smoothes the B-spline curve by increasing the degree of the curve. It is followed by a reduction of the curve degree using the least square error (LSE) approach to construct the curvature scale space (CSS) image. CSS matching is then carried out. Our method combines the advantages of B-spline that are continuous curve representation and the robustness of CSS matching with respect to noise and affine transformation. It avoids the need for other matching algorithms that have to use the resampled points on the curve. Thus, the curve matching error is reduced. The proposed algorithm has been tested by matching similar shapes from a prototype database. The experimental results showed the robustness and accuracy of the proposed method in B-spline curve matching.
Keywords
curve fitting; image matching; least squares approximations; splines (mathematics); 2D affine-invariant contour matching; B-spline modeling; CSS matching; affine transformation; curvature scale space image; curve matching; curve smoothing; least square error; Cascading style sheets; Degradation; Image databases; Least squares methods; Noise robustness; Noise shaping; Prototypes; Shape; Spline; Testing; B-Spline model; Curvature scale space; Curve matching; Curve smoothing; Algorithms; Artificial Intelligence; Computer Simulation; Image Enhancement; Image Interpretation, Computer-Assisted; Models, Statistical; Numerical Analysis, Computer-Assisted; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Subtraction Technique;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/TPAMI.2007.1135
Filename
4293213
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