• DocumentCode
    1104333
  • Title

    2D Affine-Invariant Contour Matching Using B-Spline Model

  • Author

    Wang, Yue ; Teoh, Eam Khwang

  • Author_Institution
    Nanyang Technol. Univ., Singapore
  • Volume
    29
  • Issue
    10
  • fYear
    2007
  • Firstpage
    1853
  • Lastpage
    1858
  • Abstract
    This paper presents a new affine-invariant matching algorithm based on B-spline modeling, which solves the problem of the nonuniqueness of B-spline in curve matching. This method first smoothes the B-spline curve by increasing the degree of the curve. It is followed by a reduction of the curve degree using the least square error (LSE) approach to construct the curvature scale space (CSS) image. CSS matching is then carried out. Our method combines the advantages of B-spline that are continuous curve representation and the robustness of CSS matching with respect to noise and affine transformation. It avoids the need for other matching algorithms that have to use the resampled points on the curve. Thus, the curve matching error is reduced. The proposed algorithm has been tested by matching similar shapes from a prototype database. The experimental results showed the robustness and accuracy of the proposed method in B-spline curve matching.
  • Keywords
    curve fitting; image matching; least squares approximations; splines (mathematics); 2D affine-invariant contour matching; B-spline modeling; CSS matching; affine transformation; curvature scale space image; curve matching; curve smoothing; least square error; Cascading style sheets; Degradation; Image databases; Least squares methods; Noise robustness; Noise shaping; Prototypes; Shape; Spline; Testing; B-Spline model; Curvature scale space; Curve matching; Curve smoothing; Algorithms; Artificial Intelligence; Computer Simulation; Image Enhancement; Image Interpretation, Computer-Assisted; Models, Statistical; Numerical Analysis, Computer-Assisted; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Subtraction Technique;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2007.1135
  • Filename
    4293213