DocumentCode :
1104333
Title :
2D Affine-Invariant Contour Matching Using B-Spline Model
Author :
Wang, Yue ; Teoh, Eam Khwang
Author_Institution :
Nanyang Technol. Univ., Singapore
Volume :
29
Issue :
10
fYear :
2007
Firstpage :
1853
Lastpage :
1858
Abstract :
This paper presents a new affine-invariant matching algorithm based on B-spline modeling, which solves the problem of the nonuniqueness of B-spline in curve matching. This method first smoothes the B-spline curve by increasing the degree of the curve. It is followed by a reduction of the curve degree using the least square error (LSE) approach to construct the curvature scale space (CSS) image. CSS matching is then carried out. Our method combines the advantages of B-spline that are continuous curve representation and the robustness of CSS matching with respect to noise and affine transformation. It avoids the need for other matching algorithms that have to use the resampled points on the curve. Thus, the curve matching error is reduced. The proposed algorithm has been tested by matching similar shapes from a prototype database. The experimental results showed the robustness and accuracy of the proposed method in B-spline curve matching.
Keywords :
curve fitting; image matching; least squares approximations; splines (mathematics); 2D affine-invariant contour matching; B-spline modeling; CSS matching; affine transformation; curvature scale space image; curve matching; curve smoothing; least square error; Cascading style sheets; Degradation; Image databases; Least squares methods; Noise robustness; Noise shaping; Prototypes; Shape; Spline; Testing; B-Spline model; Curvature scale space; Curve matching; Curve smoothing; Algorithms; Artificial Intelligence; Computer Simulation; Image Enhancement; Image Interpretation, Computer-Assisted; Models, Statistical; Numerical Analysis, Computer-Assisted; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Subtraction Technique;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2007.1135
Filename :
4293213
Link To Document :
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