DocumentCode :
1104408
Title :
Power performance of microwave high-electron mobility transistors
Author :
Smith, P.M. ; Mishra, U.K. ; Chao, P.C. ; Palmateer, S.C. ; Hwang, J.C.M.
Author_Institution :
General Electric Company, Syracuse, NY
Volume :
6
Issue :
2
fYear :
1985
fDate :
2/1/1985 12:00:00 AM
Firstpage :
86
Lastpage :
87
Abstract :
The large-signal performance of 0.25-µm gate-length high-electron mobility transistors (HEMT\´s) operating at 15 GHz is reported. At a drain voltage of 5 V, an output power of 135 mW (0.34 W/mm) has been obtained with 8-dB associated gain and 37-percent power-added efficiency. Furthermore, in class C operation a power-added efficiency of 57 percent has been measured. These results are attributed to high transconductance (300 mS/mm), high gain (12-dB maximum stable gain at 18 GHz), low knee voltage (1.25 V), relatively high full channel current (280 mA/mm at V_{ds} = 2 V), and good RF drain-source breakdown voltage (9 V).
Keywords :
Cutoff frequency; Gallium arsenide; HEMTs; Knee; MESFETs; MODFETs; Power generation; Power measurement; Transconductance; Voltage;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1985.26052
Filename :
1485205
Link To Document :
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