Novel hardware and software solutions for a complete linear and nonlinear microwave device characterization

While S-parameter test sets are well suited for linear active device characterization, many problems are still unsolved for a complete large-signal characterization. In this paper a test set, which performs measurements of S-parameter and load-pull characteristics at the fundamental and harmonic frequencies, is used to produce a set of data (constant gain, constant output power, efficiency, and so on), which completely describes the linear and nonlinear transistor behavior. The goal is reached by means of a special design of the test set which quickly makes the measurements with a particular tracking algorithm for load-pull contours. The high speed and the accuracy that can be achieved make the test set particularly useful for production testing of microwave active devices and for power amplifier design