Title :
Framework for Multiple-Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization
Author :
Kundu, Sandipan ; Jha, Abhishek ; Chattopadhyay, Subrata ; Sengupta, Indranil ; Kapur, R.
Author_Institution :
Dept. of Comput. Sci. & Eng. (CSE), Indian Inst. of Technol., Kharagpur, Kharagpur, India
Abstract :
This brief proposes a framework to analyze multiple faults based on multiple fault simulation in a particle swarm optimization environment. Experimentation shows that up to ten faults can be diagnosed in a reasonable time. However, the scheme does not put any restriction on the number of simultaneous faults.
Keywords :
fault simulation; integrated circuit testing; particle swarm optimisation; multiple fault diagnosis; multiple fault simulation; particle swarm optimization; Automatic test pattern generation (ATPG); effect-cause analysis; fault diagnosis; multiple fault injection; particle swarm optimization (PSO);
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2013.2249542