DocumentCode
1105222
Title
Trapezoidal-groove Schottky-gate vertical-channel GaAs FET (GaAs static induction transistor)
Author
Campbell, P.M. ; Garwacki, W. ; Sears, A.R. ; Menditto, P. ; Baliga, B.J.
Author_Institution
Naval Research Laboratory, Washington, DC
Volume
6
Issue
6
fYear
1985
fDate
6/1/1985 12:00:00 AM
Firstpage
304
Lastpage
306
Abstract
This letter reports, the development of a vertical-channel. GaAs FET with the unsaturated
characteristics of the static induction transistor (SIT) and voltage blocking capability up to 100 V. The device structure utilizes the anisotropic etching properties of GaAs, in which the gate regions are formed by a double-angle evaporation into trapezoidal etched grooves. This single evaporation step simultaneously provides both source and gate metallization, and the novel trapezoidal groove geometry automatically yields a self-aligned gate with separation of source and gate onto different levels, thus eliminating the need for critical alignment arising from source-gate interdigitation.
characteristics of the static induction transistor (SIT) and voltage blocking capability up to 100 V. The device structure utilizes the anisotropic etching properties of GaAs, in which the gate regions are formed by a double-angle evaporation into trapezoidal etched grooves. This single evaporation step simultaneously provides both source and gate metallization, and the novel trapezoidal groove geometry automatically yields a self-aligned gate with separation of source and gate onto different levels, thus eliminating the need for critical alignment arising from source-gate interdigitation.Keywords
Epitaxial layers; Etching; FETs; Fabrication; Fingers; Gallium arsenide; Implants; Protection; Resists; Substrates;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/EDL.1985.26133
Filename
1485286
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