DocumentCode :
1105410
Title :
Bowtie limited diffraction beams for low-sidelobe and large depth of field imaging
Author :
Lu, Jian-Yu
Author_Institution :
Dept. of Physiol. & Biophys., Mayo Clinic, Rochester, MN, USA
Volume :
42
Issue :
6
fYear :
1995
Firstpage :
1050
Lastpage :
1063
Abstract :
Limited diffraction beams such as Bessel beams and X waves have a large depth of field and thus could have many applications. However, these beams have higher sidelobes as compared to conventional focused beams in their focal planes. In this paper, a new class of limited diffraction beams is developed. These beams are termed bowtie limited diffraction beams because they have bowtie shapes in a plane perpendicular to the beam axis. To obtain pulse-echo images of low sidelobes and a large depth of field, a bowtie limited diffraction beam is used in transmission and its 90/spl deg/ rotated response (around the beam axis) is used in reception. Unlike the summation-subtraction method developed previously, this method does not reduce image frame rate or dynamic range of signals and is not motion sensitive. The theory of the bowtie limited diffraction beams is developed. Computer simulation of the theoretical beams under practical conditions, such as finite aperture, finite bandwidth, and causal excitation, is performed with the Rayleigh-Sommerfeld diffraction formula. The simulated beams are very close to those predicted analytically over a large depth of field.
Keywords :
echo; ultrasonic diffraction; ultrasonic imaging; Rayleigh-Sommerfeld diffraction formula; bowtie limited diffraction beams; causal excitation; depth of field; finite aperture; finite bandwidth; focal planes; image frame rate; low-sidelobe imaging; pulse-echo images; summation-subtraction method; Analytical models; Apertures; Bandwidth; Computational modeling; Computer simulation; Diffraction; Dynamic range; Focusing; Predictive models; Shape;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/58.476549
Filename :
476549
Link To Document :
بازگشت