Title :
Equivalent refractive index of MQW waveguides
Author :
Saini, Mamta ; Sharma, Enakshi K.
Author_Institution :
Dept. of Phys. & Electron., Delhi Univ., India
fDate :
8/1/1996 12:00:00 AM
Abstract :
In this paper, we have proposed some new numerical and semi-analytical methods for developing an equivalent three-layer model of an MQW waveguide. The waveguiding properties like effective index, field distribution, and fractional power within the core of the waveguide of these equivalent structures are compared with those of previously reported equivalent methods. These results are also compared with the results obtained from the exact multilayer analysis of the MQW waveguide. The waveguiding properties are accurately predicted by the semi-analytical method using variational analysis, and the computational effort is significantly reduced. The use of the three-layer equivalent is illustrated in obtaining an estimation of the waveguide losses and is used to study the effect of nonlinearity
Keywords :
nonlinear optics; numerical analysis; optical films; optical losses; optical waveguide theory; optical waveguides; refractive index; semiconductor quantum wells; variational techniques; MQW waveguides; effective index; equivalent refractive index; equivalent structures; equivalent three-layer model; exact multilayer analysis; field distribution; fractional power; nonlinear optics; nonlinearity; numerical methods; semi-analytical method; semi-analytical methods; three-layer equivalent; variational analysis; waveguide losses; waveguiding properties; Boundary conditions; Nonhomogeneous media; Nonlinear optical devices; Optical losses; Optical materials; Optical modulation; Optical waveguides; Quantum well devices; Refractive index; Tellurium;
Journal_Title :
Quantum Electronics, IEEE Journal of
