DocumentCode
1105455
Title
Self-Compensating Design for Reduction of Timing and Leakage Sensitivity to Systematic Pattern-Dependent Variation
Author
Gupta, Puneet ; Kahng, Andrew B. ; Kim, Youngmin ; Sylvester, Dennis
Author_Institution
Blaze DFM Inc., Sunnyvale
Volume
26
Issue
9
fYear
2007
Firstpage
1614
Lastpage
1624
Abstract
Critical dimension (CD) variation caused by defocus is largely systematic with dense lines ldquosmilingrdquo through focus while isolated lines ldquofrown.rdquo In this paper, we propose a new design methodology that allows explicit compensation of focus-dependent CD variation, in particular, either within a cell (self-compensated cells) or across cells in a critical path (self-compensated design). By creating iso and dense variants for each library cell, we can achieve designs that are more robust to focus variation. Optimization with a mixture of dense and iso cell variants is possible, both for area and leakage power in timing constraints (critical delay), with the latter an interesting complement to existing leakage-reduction techniques, such as dual-Vth. We implement both a heuristic and mixed-integer linear-programming (MILP) solution methods to address this optimization and experimentally compare their results. Results indicate that designing with a self-compensated cell library incurs 12% area penalty and 6% leakage increase over a baseline library while compensating for focus-dependent CD variation (i.e., the design meets timing constraints across a large range of focus variation). We observe 27% area penalty and 7% leakage increase at the worst case defocus condition using only single-pitch cells. The area penalty of circuits after using both the heuristic and MILP optimization approaches is reduced to 3% while maintaining timing. We also apply the optimization to leakage, which traditionally shows very large variability due to its exponential relationship with gate CD. We conclude that a mixed iso/dense library that is combined with a sensitivity-based optimization approach yields much better area/timing/leakage tradeoffs than using a self-compensated cell library alone. Self-compensated designs show 25% less leakage power on average at the worst defocus condition compared to a design employing a conventional library for the benchmarks studied.
Keywords
design for manufacture; integer programming; integrated circuit design; integrated circuit manufacture; leakage currents; linear programming; MILP optimization; critical dimension variation; leakage sensitivity; mixed-integer linear-programming; self-compensated cells; self-compensating design; systematic pattern-dependent variation; timing reduction; Circuits; Constraint optimization; Delay; Design methodology; Libraries; Manufacturing processes; Optimization methods; Process control; Robustness; Timing; Across-chip linewidth variation (ACLV); design for manufacturability; focus; leakage; self-compensating; systematic variation;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2007.895759
Filename
4294034
Link To Document