• DocumentCode
    1105455
  • Title

    Self-Compensating Design for Reduction of Timing and Leakage Sensitivity to Systematic Pattern-Dependent Variation

  • Author

    Gupta, Puneet ; Kahng, Andrew B. ; Kim, Youngmin ; Sylvester, Dennis

  • Author_Institution
    Blaze DFM Inc., Sunnyvale
  • Volume
    26
  • Issue
    9
  • fYear
    2007
  • Firstpage
    1614
  • Lastpage
    1624
  • Abstract
    Critical dimension (CD) variation caused by defocus is largely systematic with dense lines ldquosmilingrdquo through focus while isolated lines ldquofrown.rdquo In this paper, we propose a new design methodology that allows explicit compensation of focus-dependent CD variation, in particular, either within a cell (self-compensated cells) or across cells in a critical path (self-compensated design). By creating iso and dense variants for each library cell, we can achieve designs that are more robust to focus variation. Optimization with a mixture of dense and iso cell variants is possible, both for area and leakage power in timing constraints (critical delay), with the latter an interesting complement to existing leakage-reduction techniques, such as dual-Vth. We implement both a heuristic and mixed-integer linear-programming (MILP) solution methods to address this optimization and experimentally compare their results. Results indicate that designing with a self-compensated cell library incurs 12% area penalty and 6% leakage increase over a baseline library while compensating for focus-dependent CD variation (i.e., the design meets timing constraints across a large range of focus variation). We observe 27% area penalty and 7% leakage increase at the worst case defocus condition using only single-pitch cells. The area penalty of circuits after using both the heuristic and MILP optimization approaches is reduced to 3% while maintaining timing. We also apply the optimization to leakage, which traditionally shows very large variability due to its exponential relationship with gate CD. We conclude that a mixed iso/dense library that is combined with a sensitivity-based optimization approach yields much better area/timing/leakage tradeoffs than using a self-compensated cell library alone. Self-compensated designs show 25% less leakage power on average at the worst defocus condition compared to a design employing a conventional library for the benchmarks studied.
  • Keywords
    design for manufacture; integer programming; integrated circuit design; integrated circuit manufacture; leakage currents; linear programming; MILP optimization; critical dimension variation; leakage sensitivity; mixed-integer linear-programming; self-compensated cells; self-compensating design; systematic pattern-dependent variation; timing reduction; Circuits; Constraint optimization; Delay; Design methodology; Libraries; Manufacturing processes; Optimization methods; Process control; Robustness; Timing; Across-chip linewidth variation (ACLV); design for manufacturability; focus; leakage; self-compensating; systematic variation;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2007.895759
  • Filename
    4294034