An intercomparison of measurement techniques for the determination of the dielectric properties of solids at near millimetre wavelengths

Author

Birch, James R. ; Simonis, George J. ; Afsar, M.N. ; Clarke, R.N. ; Dutta, J.M. ; Frost, H.M. ; Gerbaux, X. ; Hadni, A. ; Hall, William F. ; Heidinger, Roland ; Ho, William W. ; Jones, C.R. ; Königer, Franz ; Moore, Rick L. ; Matsuo, Hiroshi ; Nakano, T.

Author_Institution

Nat. Phys. Lab., Teddington, UK

Volume

42

Issue

6

fYear

1994

fDate

6/1/1994 12:00:00 AM

Firstpage

956

Lastpage

965

Abstract

The results of a measurement intercomparison aimed at assessing the systematic errors in near-millimetre-wavelength dielectric measurements on reasonably transparent solid specimens are presented and discussed. Various monochromatic, broad band, guided wave and free space measurement methods were intercompared in the frequency region from 30 to 900 GHz using round-robin measurements of the refractive index and absorption coefficient of seven specimens. Typically, systematic errors of up to 1% were found in the refractive index results, while very much larger systematic errors were found in the absorption results

Keywords

dielectric measurement; measurement errors; microwave measurement; refractive index measurement; 30 to 900 GHz; EHF; THF; absorption coefficient; broad band method; dielectric properties; free space measurement method; guided wave method; measurement techniques; monochromatic method; near millimetre wavelengths; refractive index; round-robin measurements; solid dielectrics; systematic errors; Absorption; Dielectric measurements; Extraterrestrial measurements; Laboratories; Measurement techniques; Optical materials; Optical refraction; Optical variables control; Refractive index; Solids;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.293563

Filename

293563