• DocumentCode
    1105630
  • Title

    A three-dimensional photoresist image simulator: TRIPS-I

  • Author

    Matsuzawa, T. ; Ito, T. ; Tanuma, M. ; Hasegawa, N. ; Sunami, H.

  • Author_Institution
    Hitachi Ltd., Tokyo, Japan
  • Volume
    6
  • Issue
    8
  • fYear
    1985
  • fDate
    8/1/1985 12:00:00 AM
  • Firstpage
    416
  • Lastpage
    418
  • Abstract
    A simulator for a three-dimensional (3-D) photoresist image formation on flat substrates has been developed. Named Three-Dimensional Resist Imaging Process Simulator-I (TRIPS-I), the simulator consists of three subsimulators: one for the two-dimensional (2-D) distribution of projected light intensity, one for 3-D photosensitizer concentration distribution, and one for 3-D photoresist development. In regard to the first two, conventional procedures have been employed. The last, however, involves adoption of a ray tracing model based on the principle of least time.
  • Keywords
    Equations; Helium; Indium tin oxide; Laboratories; Optical imaging; Optical refraction; Optical surface waves; Ray tracing; Resists; Two dimensional displays;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1985.26175
  • Filename
    1485328