DocumentCode :
1105649
Title :
Preparation and properties of in-situ YBaCuO films on Si substrates with buffer layers
Author :
Meng, X.F. ; Pierce, F.S. ; Wong, K.M. ; Amos, R.S. ; Xu, C.H. ; Deaver, B.S., Jr. ; Poon, S.J.
Author_Institution :
Dept. of Phys., Virginia Univ., Charlottesville, VA, USA
Volume :
27
Issue :
2
fYear :
1991
fDate :
3/1/1991 12:00:00 AM
Firstpage :
1638
Lastpage :
1641
Abstract :
High-Tc YBaCuO superconducting films have been prepared in-situ on Si substrates with buffer layers using off-axis single-target RF magnetron sputtering. A special cylinder heater with a reflecting cone was used to grow in-situ YBaCuO films on different buffer layers, such as Y-stabilized ZrO2 (YSZ), LaAlO3, LaGaO3, NdAlO3, NdGaO3, SrTiO3 , and MgO. The YBaCuO films on YSZ and LaAlO3 buffer layers have Tc(zero) of 84 K and 83 K, respectively. Films deposited at substrate temperatures above 650°C have preferential orientation with c-axis perpendicular to the film surface. The films also show excellent surface smoothness up to atomic scale with a roughness of 5 Å. The qualities of the films as well as the dielectric properties of the substrate and buffer layers are favorable for microelectronic applications, especially for high-frequency applications. High-Tc microbridges have been fabricated using the films
Keywords :
barium compounds; high-temperature superconductors; sputtered coatings; superconducting junction devices; superconducting thin films; yttrium compounds; LaAlO3; LaGaO3; MgO; NdAlO3; NdGaO3; Si; SrTiO3; YBaCuO-Si; ZrO2-Y2O3; atomic scale; buffer layers; c-axis perpendicular; dielectric properties; high temperature superconductor; high-frequency applications; microbridges; microelectronic applications; off-axis single-target RF magnetron sputtering; preferential orientation; roughness; superconducting films; Buffer layers; Dielectric substrates; Optical films; Radio frequency; Rough surfaces; Semiconductor films; Superconducting films; Superconducting magnets; Surface roughness; Yttrium barium copper oxide;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.133499
Filename :
133499
Link To Document :
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