Title :
A weighted random pattern test generation system
Author :
Kapur, Rohit ; Patil, Srinivas ; Snethen, Thomas J. ; Williams, T.W.
Author_Institution :
IBM Microelectron., Mountain View, CA, USA
fDate :
8/1/1996 12:00:00 AM
Abstract :
This paper describes a weight generation algorithm that is driven by tests created by a test generator. New concepts with regard to throwing away ineffective weight sets are developed as an integral part of the system. Various parameters that help improve the effectiveness of the weight generation system are discussed
Keywords :
automatic test software; convergence; integrated circuit testing; logic testing; logic testing; weight generation algorithm; weighted random pattern test generation system; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Integrated circuit testing; Logic testing; Microelectronics; Signal generators; System testing; Test pattern generators;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
