• DocumentCode
    1105788
  • Title

    A weighted random pattern test generation system

  • Author

    Kapur, Rohit ; Patil, Srinivas ; Snethen, Thomas J. ; Williams, T.W.

  • Author_Institution
    IBM Microelectron., Mountain View, CA, USA
  • Volume
    15
  • Issue
    8
  • fYear
    1996
  • fDate
    8/1/1996 12:00:00 AM
  • Firstpage
    1020
  • Lastpage
    1025
  • Abstract
    This paper describes a weight generation algorithm that is driven by tests created by a test generator. New concepts with regard to throwing away ineffective weight sets are developed as an integral part of the system. Various parameters that help improve the effectiveness of the weight generation system are discussed
  • Keywords
    automatic test software; convergence; integrated circuit testing; logic testing; logic testing; weight generation algorithm; weighted random pattern test generation system; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Integrated circuit testing; Logic testing; Microelectronics; Signal generators; System testing; Test pattern generators;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.511581
  • Filename
    511581
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1105788