Title :
A new self-aligned GaAs FET with a Mo/WSixT-gate
Author :
Suzuki, M. ; Kuriyama, Y. ; Hirayama, M.
Author_Institution :
NTT Atsugi Electrical Communication Laboratories, Kanagawa, Japan
fDate :
10/1/1985 12:00:00 AM
Abstract :
An n+-layer and ohmic electrode self-aligned (NOSA) GaAs FET is a new self-aligned GaAs FET in which n+-layers and ohmic contacts in the source and the drain regions are self-aligned to a T-shaped gate formed with Mo and WSix(≈0.6) double layers. Using the NOSA FET structure, the device area can be easily reduced because no alignment margin is needed. The fabricated FET´s exhibit a transconductance gmof 170 mS/mm.
Keywords :
Annealing; Contact resistance; Electrical resistance measurement; Electrodes; FETs; Gallium arsenide; Ion implantation; Ohmic contacts; Threshold voltage; Transconductance;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/EDL.1985.26223