DocumentCode :
1106262
Title :
Test results from the SMES proof of principle experiment
Author :
Pfotenhauer, J.M. ; Abdelsalam, M.K. ; Bodker, F. ; Huttleston, D. ; Jiang, Z. ; Lokken, O.D. ; Scherbarth, D. ; Tao, B. ; Yu, D.
Author_Institution :
Wisconsin Univ., Madison, WI, USA
Volume :
27
Issue :
2
fYear :
1991
fDate :
3/1/1991 12:00:00 AM
Firstpage :
1704
Lastpage :
1707
Abstract :
A proof-of-principle experiment (POPE) has been conducted to demonstrate the stability and operation of the superconducting magnetic energy storage (SMES) conductor in an engineering test model (ETM) design. The experimental facility includes: a 100-kA DC power supply; a 4-T, 1-m bore, background field split solenoid: a three-turn-1-m-diameter test coil for the ETM conductor; a dewar for operation of the solenoid and test coil, at 1.8 K and 1 atm; and support systems for vacuum, helium supply and recovery, and data acquisition. The test facility exactly duplicates the electric, magnetic, and thermal conditions expected for the ETM conductor. A report is presented on measurements of conductor stability vs. transport current, applied magnetic field, and cooling from liquid helium. The measurements characterize the conductor´s stability against finite-length traveling normal zones and against quenches resulting from transient normal zones. The data qualify the conductor for dependable use at 50 kA, 4 T, and 1.8 K
Keywords :
stability; superconducting magnet energy storage; test facilities; 1 atm; 1.8 K; 4 T; 50 kA; SMES; applied magnetic field; background field split solenoid; engineering test model; finite-length traveling normal zones; operation; proof-of-principle experiment; quenches; stability; superconducting magnetic energy storage; test facility; transient normal zones; transport current; Conductors; Design engineering; Helium; Magnetic field measurement; Samarium; Solenoids; Stability; Superconducting coils; Superconducting magnetic energy storage; System testing;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.133518
Filename :
133518
Link To Document :
بازگشت