DocumentCode
1106295
Title
A novel method of reducing the storage time of transistors
Author
Narain, J.
Author_Institution
Indian Institute of Technology, Kanpur, India
Volume
6
Issue
11
fYear
1985
fDate
11/1/1985 12:00:00 AM
Firstpage
578
Lastpage
579
Abstract
During the transistor fabrication a recombination mechanism is incorporated within the base to reduce the storage time. In the emitter diffusion process, besides emitter, the same diffusion is also done in an annular region (within base) which surrounds the emitter. Connecting the base contact metal pattern to both the ohmic base contact and the annular diffused region provides a path for the majority and minority carriers to recombine. This additional recombination mechanism reduces the storage time of transistors.
Keywords
Circuit testing; Clamps; Conductivity; Fabrication; Gold; Metallization; Radiative recombination; Schottky diodes; Semiconductor diodes; Silicon;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/EDL.1985.26236
Filename
1485389
Link To Document