• DocumentCode
    1106295
  • Title

    A novel method of reducing the storage time of transistors

  • Author

    Narain, J.

  • Author_Institution
    Indian Institute of Technology, Kanpur, India
  • Volume
    6
  • Issue
    11
  • fYear
    1985
  • fDate
    11/1/1985 12:00:00 AM
  • Firstpage
    578
  • Lastpage
    579
  • Abstract
    During the transistor fabrication a recombination mechanism is incorporated within the base to reduce the storage time. In the emitter diffusion process, besides emitter, the same diffusion is also done in an annular region (within base) which surrounds the emitter. Connecting the base contact metal pattern to both the ohmic base contact and the annular diffused region provides a path for the majority and minority carriers to recombine. This additional recombination mechanism reduces the storage time of transistors.
  • Keywords
    Circuit testing; Clamps; Conductivity; Fabrication; Gold; Metallization; Radiative recombination; Schottky diodes; Semiconductor diodes; Silicon;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1985.26236
  • Filename
    1485389