Title :
Bulk unipolar camel diodes formed using indium implantation into silicon
Author :
Shannon, J.M. ; Goldsmith, B.J.
Author_Institution :
Philips Research Laboratories, Redhill, Surrey
fDate :
11/1/1985 12:00:00 AM
Abstract :
Bulk unipolar camel diodes have been made by implanting indium and arsenic into 〈100〉 silicon at low energies. It is found that a wide range of barrier heights can be obtained simply by selecting the indium energy, ideality factors being <1.1 in some cases, and leakage currents <150 nA cm-2following activation of the implants at 650°C.
Keywords :
Annealing; Boron; Hot carrier injection; Implants; Impurities; Indium; Leakage current; Schottky diodes; Silicon; Tail;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/EDL.1985.26238