Title :
Cause-Effect Analysis for Multiple Fault Detection in Combinational Networks
Author :
Bossen, D.C. ; Hong, Se June
Author_Institution :
IEEE
Abstract :
The important problem of generating test patterns to detect multiple faults has received little attention, mainly due to their computational complexity. The theoretical results of this paper show that near minimal tests for multiple faults can be generated with complexity of computation comparable to that of single faults.
Keywords :
Cause-effect analysis, combinational networks, multiple faults, redundant networks, test pattern generation.; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Intelligent networks; Labeling; Logic gates; Logic testing; Pattern analysis; Test pattern generators; Cause-effect analysis, combinational networks, multiple faults, redundant networks, test pattern generation.;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/T-C.1971.223124
