• DocumentCode
    1106742
  • Title

    Cause-Effect Analysis for Multiple Fault Detection in Combinational Networks

  • Author

    Bossen, D.C. ; Hong, Se June

  • Author_Institution
    IEEE
  • Issue
    11
  • fYear
    1971
  • Firstpage
    1252
  • Lastpage
    1257
  • Abstract
    The important problem of generating test patterns to detect multiple faults has received little attention, mainly due to their computational complexity. The theoretical results of this paper show that near minimal tests for multiple faults can be generated with complexity of computation comparable to that of single faults.
  • Keywords
    Cause-effect analysis, combinational networks, multiple faults, redundant networks, test pattern generation.; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Intelligent networks; Labeling; Logic gates; Logic testing; Pattern analysis; Test pattern generators; Cause-effect analysis, combinational networks, multiple faults, redundant networks, test pattern generation.;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/T-C.1971.223124
  • Filename
    1671717
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1106742