DocumentCode :
110687
Title :
Investigation on Switching Energy Losses in Reversely Switched Dynistor
Author :
Haiyang Wang ; Xiaoping He ; Weiqing Chen ; Linshen Xie ; Jingzhi Zhou ; Binjie Xue ; Fan Guo ; Guowei Zhang ; Zhiqiang Chen ; Zhengzhong Zeng
Author_Institution :
Northwest Inst. of Nucl. Technol., Xi´an, China
Volume :
29
Issue :
4
fYear :
2014
fDate :
Apr-14
Firstpage :
1553
Lastpage :
1556
Abstract :
This paper presents theoretical and experimental results on the energy loss characteristics of reversely switched dynistor (RSD) under high-current conditions. Theoretical analysis was performed based on a 1-D modified model by taking account into the carrier-carrier scattering effect and auger recombination effect during the conducting process. The experimental results of energy losses in RSD at various amplitudes of high pulse current were accurately obtained using the direct current injection method. The typical experimental results show that a single RSD has a voltage drop of approximately 9 V with a pulse current of 150 kA, transferred charge of 26.5 C. The theoretical calculated voltage drop based on 1-D modified model is approximately 7.7 V under the same conditions. The theoretical results based on the 1-D modified model almost agree well with the experimental results.
Keywords :
Auger effect; electric potential; electron-hole recombination; losses; power semiconductor switches; 1D modified model; Auger recombination effect; RSD; carrier-carrier scattering effect; conducting process; current 150 kA; direct current injection method; energy loss characteristics; high pulse current; high-current conditions; reversely switched dynistor; switching energy losses; voltage drop; Current measurement; Energy loss; Plasmas; Power dissipation; Pulse generation; Switches; Voltage measurement; Energy loss; high current; pulsed power; reversely switched dynistor (RSD); solid-state switches;
fLanguage :
English
Journal_Title :
Power Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8993
Type :
jour
DOI :
10.1109/TPEL.2013.2279072
Filename :
6589016
Link To Document :
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