• DocumentCode
    11070
  • Title

    Study of a Permanent Shunt Across a TMR Reader With an Ultralow RA Barrier

  • Author

    FuQiang Zheng ; ZhaoYu Teng ; ChongXi Song ; Yun Zhang ; Chan Chen

  • Author_Institution
    Electr. Characterization Eng. Dept., SAE Technol. Dev. Co. Ltd., Dongguan, China
  • Volume
    14
  • Issue
    4
  • fYear
    2014
  • fDate
    Dec. 2014
  • Firstpage
    1068
  • Lastpage
    1073
  • Abstract
    This paper experimentally presents the permanent-shunt resistance (PSR) effect on electrostatic discharge (ESD) threshold of a MgO-based tunnel magnetoresistance reader with an ultralow resistance-area (RA) barrier. Parallel-connected permanent shunts of different values are designed for the experiment. The PSR shunt can improve the ESD threshold, but it also brings some degradations on the dynamic performance of the read signal, and a tradeoff is needed between the ESD protection and the read signal. “Barrier defect enlargement” mode was found effective to explain the ESD damage mechanism in the low RA reader, and the slope factor between normalized amplitude and normalized magnetic reader resistance is related to the PSR value strongly. Based on the RA value, PSR shunt value, and slope factor between normalized amplitude and normalized magnetic reader resistance, the RA of the defective area can be determined to be around one quarter of RA of the magnetic tunnel junction RA.
  • Keywords
    electrostatic discharge; magnesium compounds; magnetic tunnelling; ESD threshold; MgO; PSR effect; PSR shunt value; RA barrier; barrier defect enlargement mode; damage mechanism; electrostatic discharge threshold; magnetic tunnel junction; normalized amplitude; normalized magnetic reader resistance; permanent-shunt resistance effect; slope factor; tunnel magnetoresistance reader; ultralow resistance-area barrier; Electrostatic discharges; Integrated circuit modeling; Magnetic heads; Magnetic tunneling; Noise; Stress; Tunneling magnetoresistance; ESD; Magnetic recording; permanent shunt; permanent-shunt; read head; tunneling magnetoresistance;
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2014.2365043
  • Filename
    6936329