DocumentCode :
1107001
Title :
Quasi-Peak-to-RMS Voltage Conversion
Author :
Cook, James H.
Author_Institution :
The IIT Research Institute Staff at The Department of Defense Electromagnetic Compatibility Analysis Center, Annapolis, MD 21402 (301) 267-2350
Issue :
1
fYear :
1979
Firstpage :
9
Lastpage :
12
Abstract :
A technique is presented by which the conversion between quasi-peak and rms voltage levels may be made for any noise process for which the relative amplitude probability distribution is known. The technique is not exact, since it requires that the time waveform of the quasi-peak voltage be constant. However, the resulting error seems to be smail for many cases. Several results obtained using the techniques are given and compared with measurements. An analysis is also presented of the effect of the constant quasi-peak voltage requirement on the error.
Keywords :
Capacitors; Circuit noise; Degradation; Detectors; Equations; Integrated circuit noise; Noise level; Noise measurement; Quadratic programming; Voltage; APD; Quasi-peak; rms;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.1979.303790
Filename :
4091237
Link To Document :
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