• DocumentCode
    1107127
  • Title

    Simulation of Carbon Nanotube FETs Including Hot-Phonon and Self-Heating Effects

  • Author

    Hasan, Sayed ; Alam, Muhammad Ashraful ; Lundstrom, Mark S.

  • Author_Institution
    Texas Instrum., Dallas
  • Volume
    54
  • Issue
    9
  • fYear
    2007
  • Firstpage
    2352
  • Lastpage
    2361
  • Abstract
    The effects of the nonequilibrium population of optical phonon (hot-phonon effect) and acoustic phonon (self-heating effect) on the dc performance of carbon nanotube (CNT) MOSFET are examined by solving coupled semiclassical electron and phonon transport equations. In this paper, the numerical solution of these coupled transport equations is described. Full-band electron and phonon Boltzmann transport equations are solved to simulate the electron and phonon transport. Electron-phonon scattering rates are calculated using the tight-binding approach and the phonon-phonon scattering by relaxation time approximation (optical phonon relaxation time extracted by fitting the measured data of metallic tube). We show that the dc ballisticity of a CNT MOSFET degrades by approximately 10% due to hot-phonon effects, which is a much smaller degradation compared to two-terminal measurement of metallic tubes. Self-heating of the tube is also examined and is found to be insignificant for a single-tube transistor.
  • Keywords
    Boltzmann equation; MOSFET; carbon nanotubes; Boltzmann transport equation; CNT MOSFET; acoustic phonon; carbon nanotube; dc ballisticity; dc performance; electron transport equation; electron-phonon scattering; hot-phonon effect; joule-heating effects; optical phonon; phonon transport equation; phonon-phonon scattering; relaxation time approximation; self-heating effect; tight-binding approach; Acoustic scattering; Boltzmann equation; Carbon nanotubes; Data mining; Degradation; Electron optics; MOSFET circuits; Optical coupling; Optical scattering; Phonons; Boltzmann Transport Equation (BTE); carbon nanotube; electron-phonon interaction; hot-phonon effects; joule-heating effects; phonon scattering; transistor;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2007.903291
  • Filename
    4294208