DocumentCode
1107127
Title
Simulation of Carbon Nanotube FETs Including Hot-Phonon and Self-Heating Effects
Author
Hasan, Sayed ; Alam, Muhammad Ashraful ; Lundstrom, Mark S.
Author_Institution
Texas Instrum., Dallas
Volume
54
Issue
9
fYear
2007
Firstpage
2352
Lastpage
2361
Abstract
The effects of the nonequilibrium population of optical phonon (hot-phonon effect) and acoustic phonon (self-heating effect) on the dc performance of carbon nanotube (CNT) MOSFET are examined by solving coupled semiclassical electron and phonon transport equations. In this paper, the numerical solution of these coupled transport equations is described. Full-band electron and phonon Boltzmann transport equations are solved to simulate the electron and phonon transport. Electron-phonon scattering rates are calculated using the tight-binding approach and the phonon-phonon scattering by relaxation time approximation (optical phonon relaxation time extracted by fitting the measured data of metallic tube). We show that the dc ballisticity of a CNT MOSFET degrades by approximately 10% due to hot-phonon effects, which is a much smaller degradation compared to two-terminal measurement of metallic tubes. Self-heating of the tube is also examined and is found to be insignificant for a single-tube transistor.
Keywords
Boltzmann equation; MOSFET; carbon nanotubes; Boltzmann transport equation; CNT MOSFET; acoustic phonon; carbon nanotube; dc ballisticity; dc performance; electron transport equation; electron-phonon scattering; hot-phonon effect; joule-heating effects; optical phonon; phonon transport equation; phonon-phonon scattering; relaxation time approximation; self-heating effect; tight-binding approach; Acoustic scattering; Boltzmann equation; Carbon nanotubes; Data mining; Degradation; Electron optics; MOSFET circuits; Optical coupling; Optical scattering; Phonons; Boltzmann Transport Equation (BTE); carbon nanotube; electron-phonon interaction; hot-phonon effects; joule-heating effects; phonon scattering; transistor;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2007.903291
Filename
4294208
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