• DocumentCode
    110739
  • Title

    Formal Vulnerability Analysis of Security Components

  • Author

    Feiten, Linus ; Sauer, Matthias ; Schubert, Tobias ; Tomashevich, Victor ; Polian, Ilia ; Becker, Bernd

  • Author_Institution
    Albert Ludwigs Univ. of Freiburg, Freiburg, Germany
  • Volume
    34
  • Issue
    8
  • fYear
    2015
  • fDate
    Aug. 2015
  • Firstpage
    1358
  • Lastpage
    1369
  • Abstract
    Vulnerability to malicious fault attacks is an emerging concern for hardware circuits that are employed in mobile and embedded systems and process sensitive data. We describe a new methodology to assess the vulnerability of a circuit to such attacks, taking into account built-in protection mechanisms. Our method is based on accurate modeling of fault effects and detection status expressed by Boolean satisfiability (SAT) formulas. Vulnerability is quantified based on the number of solutions of these formulas, which are determined by an efficient #SAT solver. We demonstrate the applicability of this method for design space exploration of a pseudo random number generator and for calculating the attack success rate in a multiplier circuit protected by robust error-detecting codes.
  • Keywords
    Boolean algebra; computability; embedded systems; error detection codes; integrated circuits; mobile handsets; random number generation; #SAT solver; Boolean satisfiability formulas; SAT formulas; built-in protection mechanisms; design space exploration; embedded systems; fault effects; formal vulnerability analysis; hardware circuits; malicious fault attacks; mobile systems; multiplier circuit; process sensitive data; pseudorandom number generator; robust error-detecting codes; security components; Circuit faults; Clocks; Cryptography; Hardware; Integrated circuit modeling; Sequential circuits; Error detection; Fault attacks; Random Number Generators; Satisfiability; Vulnerability analysis; fault attacks; random number generators; satisfiability (SAT); vulnerability analysis;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2015.2448687
  • Filename
    7131502