DocumentCode
110739
Title
Formal Vulnerability Analysis of Security Components
Author
Feiten, Linus ; Sauer, Matthias ; Schubert, Tobias ; Tomashevich, Victor ; Polian, Ilia ; Becker, Bernd
Author_Institution
Albert Ludwigs Univ. of Freiburg, Freiburg, Germany
Volume
34
Issue
8
fYear
2015
fDate
Aug. 2015
Firstpage
1358
Lastpage
1369
Abstract
Vulnerability to malicious fault attacks is an emerging concern for hardware circuits that are employed in mobile and embedded systems and process sensitive data. We describe a new methodology to assess the vulnerability of a circuit to such attacks, taking into account built-in protection mechanisms. Our method is based on accurate modeling of fault effects and detection status expressed by Boolean satisfiability (SAT) formulas. Vulnerability is quantified based on the number of solutions of these formulas, which are determined by an efficient #SAT solver. We demonstrate the applicability of this method for design space exploration of a pseudo random number generator and for calculating the attack success rate in a multiplier circuit protected by robust error-detecting codes.
Keywords
Boolean algebra; computability; embedded systems; error detection codes; integrated circuits; mobile handsets; random number generation; #SAT solver; Boolean satisfiability formulas; SAT formulas; built-in protection mechanisms; design space exploration; embedded systems; fault effects; formal vulnerability analysis; hardware circuits; malicious fault attacks; mobile systems; multiplier circuit; process sensitive data; pseudorandom number generator; robust error-detecting codes; security components; Circuit faults; Clocks; Cryptography; Hardware; Integrated circuit modeling; Sequential circuits; Error detection; Fault attacks; Random Number Generators; Satisfiability; Vulnerability analysis; fault attacks; random number generators; satisfiability (SAT); vulnerability analysis;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2015.2448687
Filename
7131502
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