DocumentCode :
1107407
Title :
Scaling Behaviors of Graphene Nanoribbon FETs: A Three-Dimensional Quantum Simulation Study
Author :
Ouyang, Yijian ; Yoon, Youngki ; Guo, Jing
Author_Institution :
Univ. of Florida, Gainesville
Volume :
54
Issue :
9
fYear :
2007
Firstpage :
2223
Lastpage :
2231
Abstract :
The scaling behaviors of graphene nanoribbon (GNR) Schottky barrier field-effect transistors (SBFETs) are studied by self-consistently solving the nonequilibrium Green´s function transport equation in an atomistic basis set with a 3-D Poisson equation. The armchair edge GNR channel shares similarities with a zigzag carbon nanotube; however, it has a different geometry and quantum confinement boundary condition in the transverse direction. The results indicate that the I-V characteristics are ambipolar and strongly depend on the GNR width because the bandgap of the GNR is approximately inversely proportional to its width, which agrees with recent experiments. A multiple gate geometry improves immunity to short channel effects; however, it offers smaller improvement than it does for Si MOSFETs in terms of the on-current and transconductance. Reducing the oxide thickness is more useful for improving transistor performance than using a high-k gate insulator. Significant increase of the minimal leakage current is observed when the channel length is scaled below 10 nm because the small effective mass facilitates strong source-drain tunneling. The GNRFET, therefore, does not promise to extend the ultimate scaling limit of Si MOSFETs. The intrinsic switching speed of a GNR SBFET, however, is several times faster than that of Si MOSFETs, which could lead to promising high-speed electronics applications, where the large leakage of GNR SBFETs is of less concern.
Keywords :
Schottky gate field effect transistors; carbon nanotubes; electric properties; leakage currents; nanoelectronics; semiconductor device models; tunnelling; 3D Poisson equation; 3D quantum simulation; GNRFET; I-V characteristics; MOSFET; Schottky barrier field-effect transistors; channel length; effective mass; graphene nanoribbon FET; high-speed electronics; intrinsic switching; minimal leakage current; multiple gate geometry; nonequilibrium Green function transport equation; oxide thickness; scaling behaviors; short channel effects immunity; source-drain tunneling; Boundary conditions; Carbon nanotubes; FETs; Geometry; Green´s function methods; MOSFETs; Photonic band gap; Poisson equations; Potential well; Schottky barriers; Ballistic transport; Schottky barrier; device simulation; graphene field-effect transistor; quantum transport; transistor scaling;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2007.902692
Filename :
4294234
Link To Document :
بازگشت