A new half-micrometer p-channel MOSFET with efficient punchthrough stops

This paper describes design and characteristics of a new half-micrometer buried p-channel MOSFET with efficient punch-through stops. The approach for scaling down the buried p-channel MOSFET´s is discussed by using two-dimensional process/device simulations and experimental results. The efficient punchthrough stops have realized high punchthrough resistance in half-micrometer dimensions without increasing the n-well concentration and extreme scaling of channel and source-drain junction depths. Moreover, this p-channel MOSFET shows the breakdown voltage to be as high as 10 V. The fabrication sequence is compatible with the conventional n-channel LDD MOSFET´s.