DocumentCode
1107690
Title
A time dependent hydrodynamic device simulator SNU-2D with new discretization scheme and algorithm
Author
Choi, Woo-Sung ; Ahn, Jae-Gyung ; Park, Young-June ; Min, Hong-Shick ; Hwang, Chang-Gyu
Author_Institution
Dept. of Electron. Eng., Seoul Nat. Univ., South Korea
Volume
13
Issue
7
fYear
1994
fDate
7/1/1994 12:00:00 AM
Firstpage
899
Lastpage
908
Abstract
A two-dimensional device simulator SNU-2D based on the hydrodynamic model is developed for the simulation and analysis of submicron devices. The simulator has the capacity for both self-consistent steady-state and transient-state simulation. To obtain better convergence and numerical stability, we adopt an improved discretization scheme for the carrier energy flux equation and a new strategy for the transient simulation. In steady-state simulation the new discretization scheme shows a considerable improvement in convergence rate and numerical accuracy compared with the existing schemes. A transient simulation study is carried out on a deep submicron n-MOSFET used in the sense amplifier of SRAM cells to investigate the gate-switching characteristic. It is found that the behavior of carrier temperature is quasi-static during the switching time even for very fast switching speed, while the behavior of impact ionization under transient mode deviates from that under dc mode as the switching speed increases
Keywords
carrier density; hot carriers; insulated gate field effect transistors; reliability; semiconductor device models; time-domain synthesis; 2D device simulator; SNU-2D; SRAM cells; algorithm; carrier energy flux equation; carrier temperature; convergence; convergence rate; deep submicron n-MOSFET; discretization scheme; gate-switching characteristic; hot carrier reliability; hydrodynamic model; improved discretization scheme; numerical accuracy; numerical stability; quasi-static; self-consistent steady-state simulation; sense amplifier; submicron devices; time dependent hydrodynamic device simulator; transient-state simulation; Analytical models; Convergence of numerical methods; Equations; Hydrodynamics; Impact ionization; MOSFET circuits; Numerical stability; Random access memory; Steady-state; Temperature sensors;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.293947
Filename
293947
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