• DocumentCode
    1108155
  • Title

    The delta-doped field-effect transistor (δFET)

  • Author

    Schubert, Erdmann F. ; Fischer, A. ; Ploog, Klaus

  • Author_Institution
    Max-Planck-Institut für Festkörperforschung, Stuttgart, Federal Republic of Germany
  • Volume
    33
  • Issue
    5
  • fYear
    1986
  • fDate
    5/1/1986 12:00:00 AM
  • Firstpage
    625
  • Lastpage
    632
  • Abstract
    A field-effect transistor (FET) using a two-dimensional electron gas (2DEG) as an electron channel is fabricated from GaAs grown by molecular-beam epitaxy. The doping profile of the field-effect transistor is described by the Dirac delta (δ) function. The subband structure of δ-doped GaAs is calculated. The characteristics of the δFET are a high concentration of the 2DEG, a high breakdown voltage of the Schottky contact, a narrow distance of the 2DEG from the gate, and a high transconductance. These properties are analyzed. Preliminary results for the extrinsic transconductance and for the transit frequency are obtained from δFET´s having nonoptimized structures.
  • Keywords
    Doping profiles; Electron mobility; Energy states; FETs; Gallium arsenide; HEMTs; Impurities; Molecular beam epitaxial growth; Potential well; Transconductance;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1986.22543
  • Filename
    1485760