Title :
Two-dimensional metal-semiconductor field effect transistor for ultra low power circuit applications
Author :
Peatman, W.C.B. ; Park, Heejung ; Shur, M.
Author_Institution :
Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
fDate :
7/1/1994 12:00:00 AM
Abstract :
We describe a novel 2-dimensional metal-semiconductor field effect transistor (2-D MESFET) in which opposing Schottky side gates formed on the sidewall of a modulation-doped AlGaAs-InGaAs heterostructure modulate the channel width and the drain current. The drain current ranged from 0 to 210 μA and the maximum measured transconductance was 212 μS (212 mS/mm) at room temperature for a 1×1 micron channel. The threshold voltage was -0.45 V and the subthreshold ideality factor was 1.30. The estimated gate capacitance was 0.8 fF/μm, or about half the equivalent capacitance of conventional HFET´s. The cutoff frequency fT was estimated to be 21 GHz. The narrow channel effect, which limits the minimum power consumption in conventional FET´s, is practically eliminated in this device.
Keywords :
III-V semiconductors; Schottky gate field effect transistors; aluminium compounds; capacitance; gallium arsenide; indium compounds; solid-state microwave devices; -0.45 V; 0 to 210 muA; 21 GHz; 212 mS/mm; 2D MESFET; AlGaAs-InGaAs; HFET; Schottky side gates; gate capacitance; modulation-doped heterostructure; two-dimensional MESFET; ultra low power circuit applications; Capacitance; Current measurement; Epitaxial layers; FETs; HEMTs; MESFETs; MODFETs; Temperature distribution; Threshold voltage; Transconductance;
Journal_Title :
Electron Device Letters, IEEE