DocumentCode
1108490
Title
Effect of doping profile variations on the performance of the permeable base transistor
Author
Gopinath, Anand ; Rankin, Bruce J.
Author_Institution
MIT Lincoln Laboratory, Lexington, MA
Volume
33
Issue
6
fYear
1986
fDate
6/1/1986 12:00:00 AM
Firstpage
816
Lastpage
821
Abstract
The cutoff frequency ft and maximum frequency of oscillation fmax of the permeable-base transistor have been calculated for devices with a fixed geometry and different doping profiles to determine the profile that gave the highest value of
The effect of different static velocity-field curves for GaAs and InP, and associated diffusion-field dependencies on device performance have also been examined. The results of the simulations show that the saturated velocity for GaAs PBT\´s has a major impact on performance. The uniformly doped device, Nd of 4 × 1016cm-3, has a higher
when the saturated velocity is larger, but the effect of the low field mobility is small. The InP device has a slightly higher
than the corresponding GaAs devices at this doping level. The 20-10-4 × 1016cm-3devices have the highest
of all the GaAs devices investigated.
The effect of different static velocity-field curves for GaAs and InP, and associated diffusion-field dependencies on device performance have also been examined. The results of the simulations show that the saturated velocity for GaAs PBT\´s has a major impact on performance. The uniformly doped device, N
when the saturated velocity is larger, but the effect of the low field mobility is small. The InP device has a slightly higher
than the corresponding GaAs devices at this doping level. The 20-10-4 × 1016cm-3devices have the highest
of all the GaAs devices investigated.Keywords
Cutoff frequency; Doping profiles; Electrodes; Finite element methods; Frequency estimation; Gallium arsenide; Geometry; Indium phosphide; Poisson equations; Semiconductor process modeling;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1986.22574
Filename
1485791
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