• DocumentCode
    1108490
  • Title

    Effect of doping profile variations on the performance of the permeable base transistor

  • Author

    Gopinath, Anand ; Rankin, Bruce J.

  • Author_Institution
    MIT Lincoln Laboratory, Lexington, MA
  • Volume
    33
  • Issue
    6
  • fYear
    1986
  • fDate
    6/1/1986 12:00:00 AM
  • Firstpage
    816
  • Lastpage
    821
  • Abstract
    The cutoff frequency ftand maximum frequency of oscillation fmaxof the permeable-base transistor have been calculated for devices with a fixed geometry and different doping profiles to determine the profile that gave the highest value of f_{\\max } The effect of different static velocity-field curves for GaAs and InP, and associated diffusion-field dependencies on device performance have also been examined. The results of the simulations show that the saturated velocity for GaAs PBT\´s has a major impact on performance. The uniformly doped device, Ndof 4 × 1016cm-3, has a higher f_{\\max } when the saturated velocity is larger, but the effect of the low field mobility is small. The InP device has a slightly higher f_{\\max } than the corresponding GaAs devices at this doping level. The 20-10-4 × 1016cm-3devices have the highest f_{\\max } of all the GaAs devices investigated.
  • Keywords
    Cutoff frequency; Doping profiles; Electrodes; Finite element methods; Frequency estimation; Gallium arsenide; Geometry; Indium phosphide; Poisson equations; Semiconductor process modeling;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1986.22574
  • Filename
    1485791