Title :
Variability analysis of interconnect structures including general nonlinear elements in SPICE-type framework
Author :
Biondi, A. ; Manfredi, Paolo ; Vande Ginste, Dries ; De Zutter, Daniel ; Canavero, Flavio G.
Author_Institution :
Dept. of Inf. Technol.-INTEC, Ghent Univ., Ghent, Belgium
Abstract :
A stochastic modelling method is developed and implemented in a SPICE framework to analyse variability effects on interconnect structures including general nonlinear elements.
Keywords :
SPICE; integrated circuit interconnections; integrated circuit modelling; multiconductor transmission lines; stochastic processes; SPICE-type framework; general nonlinear elements; interconnect structures; multiconductor transmission lines; stochastic modelling method; variability analysis;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2013.3191
