Title :
Second breakdown prediction by two-dimensonal numerical analysis of BJT turnoff
Author :
Hwang, Kyuwoon ; Navon, David H. ; Tang, Ting-wei ; Hower, P.L.
Author_Institution :
University of Massachusetts, Amherst, MA
fDate :
7/1/1986 12:00:00 AM
Abstract :
An isothermal two-dimensional numerical calculation of the potential and current distribution in an n+-p-n-n+bipolar power transistor driving an inductive load during its turnoff transient has been carried out. The transistor is initially considered to be in a heavily saturated ON-state and is then turned off by extracting a nearly constant base current. The simulation shows that during the turnoff transient, current constriction to the center of the emitter together with the increasing collector-emitter voltage produce a high electric field near the collector n-n+junction which can initiate avalanche injection. It has been found that the collector-current density is not uniform vertically (from collector to emitter) due to the current spreadout in the collector n-region. Previous one-dimensional analytical analyses of second breakdown did not consider this important effect. Thus, for an accurate prediction of reverse second breakdown voltage, the two-dimensional current flow should be considered.
Keywords :
Bipolar transistors; Circuit simulation; Current distribution; Electric breakdown; Helium; Isothermal processes; Numerical analysis; Power transistors; Transient analysis; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1986.22614