DocumentCode :
1108965
Title :
Instability of persistent current switch
Author :
Maeda, H. ; Urata, M. ; Oda, Y. ; Kageyama, M. ; Kabashima, S.
Author_Institution :
Toshiba Res. & Dev., Kawasaki, Japan
Volume :
27
Issue :
2
fYear :
1991
fDate :
3/1/1991 12:00:00 AM
Firstpage :
2124
Lastpage :
2127
Abstract :
The instability for a persistent current switch (PCS) wound bifilarly by a CuNi matrix conductor was studied experimentally and by numerical calculations. The temperature rise due to self-field AC loss during the ramping up of the current causes degradations. The quench current gradually decreases to the adiabatic value, if the current sweep rate is progressively increased. Current transfer from the current terminal to the winding limits the current capacity for the PCS wound by a thick conductor, such as 0.9 mm in diameter. A short ramp pulse causes premature quenches at extremely low currents, which may be due to heat concentration of the self-field AC loss in the conductor outer shell
Keywords :
copper alloys; losses; nickel alloys; superconducting devices; switches; adiabatic value; conductor outer shell; current capacity; current sweep rate; heat concentration; persistent current switch; premature quenches; quench current; self-field AC loss; short ramp pulse; temperature rise; Conductors; Degradation; Magnetic levitation; Magnetic switching; Niobium compounds; Persistent currents; Personal communication networks; Switches; Voltage; Wounds;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.133631
Filename :
133631
Link To Document :
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