Instability of persistent current switch

Author

Maeda, H. ; Urata, M. ; Oda, Y. ; Kageyama, M. ; Kabashima, S.

Author_Institution

Toshiba Res. & Dev., Kawasaki, Japan

Volume

27

Issue

2

fYear

1991

fDate

3/1/1991 12:00:00 AM

Firstpage

2124

Lastpage

2127

Abstract

The instability for a persistent current switch (PCS) wound bifilarly by a CuNi matrix conductor was studied experimentally and by numerical calculations. The temperature rise due to self-field AC loss during the ramping up of the current causes degradations. The quench current gradually decreases to the adiabatic value, if the current sweep rate is progressively increased. Current transfer from the current terminal to the winding limits the current capacity for the PCS wound by a thick conductor, such as 0.9 mm in diameter. A short ramp pulse causes premature quenches at extremely low currents, which may be due to heat concentration of the self-field AC loss in the conductor outer shell

Keywords

copper alloys; losses; nickel alloys; superconducting devices; switches; adiabatic value; conductor outer shell; current capacity; current sweep rate; heat concentration; persistent current switch; premature quenches; quench current; self-field AC loss; short ramp pulse; temperature rise; Conductors; Degradation; Magnetic levitation; Magnetic switching; Niobium compounds; Persistent currents; Personal communication networks; Switches; Voltage; Wounds;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.133631

Filename

133631