• DocumentCode
    110904
  • Title

    Adaptive Circuit Design Methodology and Test Applied to Millimeter-Wave Circuits

  • Author

    Plouchart, J.-O. ; Parker, Benjamin ; Sadhu, Bodhisatwa ; Valdes-Garcia, Alberto ; Friedman, Daniel ; Sanduleanu, Mihai ; Fa Wang ; Xin Li ; Balteanu, Andreea

  • Author_Institution
    T.J. Watson Res. Center, IBM, Yorktown Heights, NY, USA
  • Volume
    31
  • Issue
    6
  • fYear
    2014
  • fDate
    Dec. 2014
  • Firstpage
    8
  • Lastpage
    18
  • Abstract
    This paper presents a design methodology of millimeter-wave circuits that are insensitive to process, voltage, and temperature variations. Instead of using conventional direct sensing, the authors propose an indirect sensing method with Bayesian fusion, which simplifies the sensors and allows more adaptive circuit loops to be integrated.
  • Keywords
    Bayes methods; integrated circuit design; integrated circuit testing; millimetre wave integrated circuits; sensors; Bayesian fusion; adaptive circuit design methodology; adaptive circuit loops; millimeter-wave circuits; process variations; sensors; temperature variations; voltage variations; Adaptation models; Calibration; Data models; Design methodology; Mathematical model; Millimeter wave circuits; Sensors; System-on-chip;
  • fLanguage
    English
  • Journal_Title
    Design & Test, IEEE
  • Publisher
    ieee
  • ISSN
    2168-2356
  • Type

    jour

  • DOI
    10.1109/MDAT.2014.2343192
  • Filename
    6866192
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=110904