Title :
Adaptive Circuit Design Methodology and Test Applied to Millimeter-Wave Circuits
Author :
Plouchart, J.-O. ; Parker, Benjamin ; Sadhu, Bodhisatwa ; Valdes-Garcia, Alberto ; Friedman, Daniel ; Sanduleanu, Mihai ; Fa Wang ; Xin Li ; Balteanu, Andreea
Author_Institution :
T.J. Watson Res. Center, IBM, Yorktown Heights, NY, USA
Abstract :
This paper presents a design methodology of millimeter-wave circuits that are insensitive to process, voltage, and temperature variations. Instead of using conventional direct sensing, the authors propose an indirect sensing method with Bayesian fusion, which simplifies the sensors and allows more adaptive circuit loops to be integrated.
Keywords :
Bayes methods; integrated circuit design; integrated circuit testing; millimetre wave integrated circuits; sensors; Bayesian fusion; adaptive circuit design methodology; adaptive circuit loops; millimeter-wave circuits; process variations; sensors; temperature variations; voltage variations; Adaptation models; Calibration; Data models; Design methodology; Mathematical model; Millimeter wave circuits; Sensors; System-on-chip;
Journal_Title :
Design & Test, IEEE
DOI :
10.1109/MDAT.2014.2343192
