Title :
Multiport Measurement Method Using a Two-Port Network Analyzer With Remaining Ports Unterminated
Author :
Kam, Dong Gun ; Kim, Joungho
Author_Institution :
IBM T. J. Watson Res. Center, Yorktown Heights
Abstract :
A practical multiport measurement method is presented for the precise characterization of an N-port device using a two-port vector network analyzer. Because the 2 unused ports need not be terminated with matched loads, a test fixture can be simplified. Any influence of the reflections from the unterminated ports can be deembedded by port renormalization. The proposed method was verified with a coupled microstrip line structure.
Keywords :
S-parameters; electric connectors; multiport networks; network analysers; N-2 unused ports; N-port device; S-parameter measurement; connector; coupled microstrip line structure; multiport measurement; port renormalization; two-port vector network analyzer; unterminated ports; Cables; Displays; Distortion measurement; Fixtures; Impedance measurement; Microstrip; Page description languages; Reflection; Testing; Transmission line matrix methods; ${S}$-parameter measurement; Connector and cable; multiport network; port renormalization;
Journal_Title :
Microwave and Wireless Components Letters, IEEE
DOI :
10.1109/LMWC.2007.903467
