Title :
Photoconductive step-function sampling
Author :
Son, Joo-Hiuk ; Kim, Joungho ; Mourou, Gerard A.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
fDate :
6/1/1994 12:00:00 AM
Abstract :
Measurement of picosecond electrical signals using a photoconductive step-function gate is demonstrated analytically and experimentally. The time resolution of our step-function technique is limited only by the rise time of the step-function, which is approximately the same as the laser pulse width. Also, a regular, undoped semiconductor material, which is essential for the realization of a short-duration gate, can be used instead of the highly defected material. The use of undoped material gives 10 to 100 times higher sensitivity in the measurement than the impulse-function technique because of the high mobility of the undoped material.<>
Keywords :
electric variables measurement; measurement by laser beam; microwave measurement; photoconducting devices; signal processing equipment; photoconductive step-function gate; picosecond electrical signal measurement; step-function sampling; undoped semiconductor material; Electric variables measurement; Optical materials; Optical pulses; Photoconductivity; Sampling methods; Semiconductor lasers; Semiconductor materials; Signal analysis; Signal resolution; Space vector pulse width modulation;
Journal_Title :
Microwave and Guided Wave Letters, IEEE
