• DocumentCode
    1109544
  • Title

    Charge-control analysis of the COMFET turn-off transient

  • Author

    Fossum, Jerry G. ; McDonald, Robert J.

  • Author_Institution
    University of Florida, Gainesville, FL
  • Volume
    33
  • Issue
    9
  • fYear
    1986
  • fDate
    9/1/1986 12:00:00 AM
  • Firstpage
    1377
  • Lastpage
    1382
  • Abstract
    A quasi-static charge-control analysis of the unique transient turn-off characteristic of the COMFET is developed. The analysis describes the transient behavior in terms of steady ON-state current components that flow in the constituent MOSFET and BJT in the basic COMFET structure. The effects of the expanding depletion region at the cathode and of minority-carrier injection into the anode are properly accounted for. Consequently, the physics underlying the turnoff time is clarified, and device design criteria for shortening it, without considerably degrading the ON-state current conduction capability, are suggested.
  • Keywords
    Anodes; Cathodes; Charge carrier processes; Conductivity; Degradation; FETs; MOSFET circuits; P-n junctions; Physics; Transient analysis;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1986.22673
  • Filename
    1485890