DocumentCode :
1109803
Title :
On-Chip Voltage Down Converter to Improve SRAM Read/Write Margin and Static Power for Sub-Nano CMOS Technology
Author :
Lai, Fang-Shi ; Lee, Chia-Fu
Author_Institution :
Taiwan Semicond. Manuf. Co., Hsinchu
Volume :
42
Issue :
9
fYear :
2007
Firstpage :
2061
Lastpage :
2070
Abstract :
VDC-based dynamic power supply approach has been demonstrated to effectively improve the read margin, write margin and static power dissipation for the sub-nano SRAM design. The static power dissipation is found to be 5times improvement in the room and high temperatures while the chip is in the standby mode. The measured data indicate the excellent Vccmin improvement at around 240 mV. This 2M 65 nm SRAM chip can operate at 0.7 V with the help of the on-chip VDC. Furthermore, with the programmability of the VDC, we can optimize the read margin and write margin separately to have dramatic yield improvement. In the advancement of CMOS technology, the VDC approach can improve the future SRAM cell operation without additional external power supplies and complicate design modification.
Keywords :
CMOS memory circuits; SRAM chips; nanoelectronics; power supply circuits; SRAM cell operation; SRAM read-write margin; VDC-based dynamic power supply approach; design modification; on-chip voltage down converter; programmability; size 65 nm; static power dissipation; subnano CMOS technology; voltage 0.7 V; voltage 240 mV; CMOS technology; Energy consumption; Fluctuations; MOSFETs; Power dissipation; Power supplies; Random access memory; SRAM chips; Static power converters; Threshold voltage; Read margin; SRAM; Vccmin; static power; voltage down converter (VDC); write margin;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2007.903072
Filename :
4295196
Link To Document :
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