Title :
850 nm Oxide-VCSEL With Low Relative Intensity Noise and 40 Gb/s Error Free Data Transmission
Author :
Fei Tan ; Mong-Kai Wu ; Liu, Minggang ; Feng, Ming ; Holonyak, Nick
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Abstract :
We have designed and fabricated a high speed 850 nm oxide-confined vertical cavity surface emitting laser with an oxide aperture dimension of ~ 4 μm and a threshold current ITH=0.53 mA at room temperature (20 °C). It demonstrates a modulation bandwidth of 21.2 GHz, and achieves a laser relative intensity noise reaching standard quantum limit 2hν/P0=-154.3 dB/Hz at high bias I/ITH=10. Furthermore, error-free data transmission at 40 Gb/s is obtained at I=6.5 mA which corresponds to an energy/data efficiency of 431 fJ/bit.
Keywords :
laser cavity resonators; laser noise; optical communication equipment; optical fabrication; optical modulation; quantum well lasers; surface emitting lasers; bit rate 40 Gbit/s; current 6.5 mA; energy-data efficiency; error free data transmission; frequency 21.2 GHz; high speed oxide-confined vertical cavity surface emitting laser; laser relative intensity noise; modulation bandwidth; oxide aperture dimension; oxide-VCSEL; standard quantum limit; temperature 20 degC; threshold current; wavelength 850 nm; Laser noise; Measurement by laser beam; Optical fibers; Optical variables measurement; Vertical cavity surface emitting lasers; 40 Gb/s error free data transmission; VCSEL; ultralow laser relative intensity noise;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2013.2280726
