• DocumentCode
    1110025
  • Title

    Constant-current contour plot for the description of short-channel effects of MOS transistors

  • Author

    Kim, Choong-ki ; Goodwin-johansson, Scott ; Sharma, Dinesh

  • Author_Institution
    Korea Advanced Institute of Science and Technology, Seoul, Korea
  • Volume
    33
  • Issue
    10
  • fYear
    1986
  • fDate
    10/1/1986 12:00:00 AM
  • Firstpage
    1619
  • Lastpage
    1621
  • Abstract
    A constant-current contour plot in the V_{ds}-V_{gs} plane is proposed as a means of describing short-channel behavior of MOS transistors. Characteristics of the constant-current contour plot are presented and related to short-channel behavior. As an example, short-channel behavior of a typical NMOS technology is described utilizing constant-current contour plots that are generated from the I-V data obtained by two-dimensional device simulation.
  • Keywords
    Electron devices; Linear approximation; MOS devices; MOSFET circuits; Microelectronics; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1986.22715
  • Filename
    1485932
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1110025