• DocumentCode
    1110245
  • Title

    Application of selective silicon epitaxial growth for CMOS technology

  • Author

    Nagao, Shigeo ; Higashitani, Keiichi ; Akasaka, Yoichi ; Nakata, Hidefumi

  • Author_Institution
    Mitsubishi Electric Corporation, Itami, Japan
  • Volume
    33
  • Issue
    11
  • fYear
    1986
  • fDate
    11/1/1986 12:00:00 AM
  • Firstpage
    1738
  • Lastpage
    1744
  • Abstract
    The application of selective silicon epitaxial growth for device isolation is described. An improved selective epitaxial isolation technology is presented in the fabrication of CMOS LSI. This advanced process technology results from a superior selectivity for selective silicon deposition. A CMOS ring oscillator with a twin-well structure is fabricated by using this selective epitaxial isolation technology. The feasibility of using an oversized contact, due to the nature of its steeper oxide-to-silicon isolation boundary, is demonstrated.
  • Keywords
    CMOS technology; Dielectrics; Epitaxial growth; Fabrication; Isolation technology; Large scale integration; Oxidation; Ring oscillators; Silicon; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1986.22736
  • Filename
    1485953