DocumentCode
1110245
Title
Application of selective silicon epitaxial growth for CMOS technology
Author
Nagao, Shigeo ; Higashitani, Keiichi ; Akasaka, Yoichi ; Nakata, Hidefumi
Author_Institution
Mitsubishi Electric Corporation, Itami, Japan
Volume
33
Issue
11
fYear
1986
fDate
11/1/1986 12:00:00 AM
Firstpage
1738
Lastpage
1744
Abstract
The application of selective silicon epitaxial growth for device isolation is described. An improved selective epitaxial isolation technology is presented in the fabrication of CMOS LSI. This advanced process technology results from a superior selectivity for selective silicon deposition. A CMOS ring oscillator with a twin-well structure is fabricated by using this selective epitaxial isolation technology. The feasibility of using an oversized contact, due to the nature of its steeper oxide-to-silicon isolation boundary, is demonstrated.
Keywords
CMOS technology; Dielectrics; Epitaxial growth; Fabrication; Isolation technology; Large scale integration; Oxidation; Ring oscillators; Silicon; Very large scale integration;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1986.22736
Filename
1485953
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