Title :
Application of selective silicon epitaxial growth for CMOS technology
Author :
Nagao, Shigeo ; Higashitani, Keiichi ; Akasaka, Yoichi ; Nakata, Hidefumi
Author_Institution :
Mitsubishi Electric Corporation, Itami, Japan
fDate :
11/1/1986 12:00:00 AM
Abstract :
The application of selective silicon epitaxial growth for device isolation is described. An improved selective epitaxial isolation technology is presented in the fabrication of CMOS LSI. This advanced process technology results from a superior selectivity for selective silicon deposition. A CMOS ring oscillator with a twin-well structure is fabricated by using this selective epitaxial isolation technology. The feasibility of using an oversized contact, due to the nature of its steeper oxide-to-silicon isolation boundary, is demonstrated.
Keywords :
CMOS technology; Dielectrics; Epitaxial growth; Fabrication; Isolation technology; Large scale integration; Oxidation; Ring oscillators; Silicon; Very large scale integration;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1986.22736