DocumentCode :
1110245
Title :
Application of selective silicon epitaxial growth for CMOS technology
Author :
Nagao, Shigeo ; Higashitani, Keiichi ; Akasaka, Yoichi ; Nakata, Hidefumi
Author_Institution :
Mitsubishi Electric Corporation, Itami, Japan
Volume :
33
Issue :
11
fYear :
1986
fDate :
11/1/1986 12:00:00 AM
Firstpage :
1738
Lastpage :
1744
Abstract :
The application of selective silicon epitaxial growth for device isolation is described. An improved selective epitaxial isolation technology is presented in the fabrication of CMOS LSI. This advanced process technology results from a superior selectivity for selective silicon deposition. A CMOS ring oscillator with a twin-well structure is fabricated by using this selective epitaxial isolation technology. The feasibility of using an oversized contact, due to the nature of its steeper oxide-to-silicon isolation boundary, is demonstrated.
Keywords :
CMOS technology; Dielectrics; Epitaxial growth; Fabrication; Isolation technology; Large scale integration; Oxidation; Ring oscillators; Silicon; Very large scale integration;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1986.22736
Filename :
1485953
Link To Document :
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