DocumentCode :
1110762
Title :
Recombination dynamics in GaAs/AlxGa1- xAs quantum well structures
Author :
Fouquet, Julie E. ; Burnham, Robert D.
Author_Institution :
Hewlett-Packard Laboratories, Palo Alto, CA
Volume :
22
Issue :
9
fYear :
1986
fDate :
9/1/1986 12:00:00 AM
Firstpage :
1799
Lastpage :
1810
Abstract :
Time-resolved and excitation-dependent photoluminescence of GaAs/AlxGa1-xAs quantum well structures reveal that recombination takes place between free carriers, not excitons, at room temperature for carrier densities at and above the mid -1016cm-3level. Other samples show trapping and release of carriers from traps, evidence of dynamic Shockley, Hall, and Read recombination for optically active traps. The traps can be saturated to a large extent. Further studies show that they are associated with interfaces between different materials and that they become active at a temperature around 150 K. Results from all samples indicate that the bimolecular radiative recombination coefficient B for quantum wells is no larger than the value of B for bulk GaAs, and may in fact be smaller. This is one of the first studies of time-resolved luminescence of impurities in quantum well structures. Impurity decays at low temperatures are found to be quite slow. A spectral line which appeared to be longitudinal optical phonon-shifted emission is shown to be due to an acceptor impurity.
Keywords :
Gallium materials/devices; Photoluminescent materials/devices; Quantum-well device; Charge carrier density; Charge carrier processes; Excitons; Gallium arsenide; Impurities; Optical materials; Optical saturation; Photoluminescence; Radiative recombination; Temperature;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.1986.1073154
Filename :
1073154
Link To Document :
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