DocumentCode :
1110770
Title :
Self-Checking Combinational Logic Binary Counters
Author :
Dorr, Robert C.
Author_Institution :
Bell Telephone Laboratories, Inc.
Issue :
12
fYear :
1972
Firstpage :
1426
Lastpage :
1430
Abstract :
A high-speed, self-checking count circuit realization is attainable by using combinational logic and parity prediction. The utilization of combinational logic as opposed to sequential logic design generally minimizes the amount of software necessary for routine and diagnostic testing. Count circuits with parity prediction find application in stand-alone, self-checking processors.
Keywords :
Binary counter, error detection, integrated circuits, parallel counter, parity generation, parity prediction, self-checking logic.; Application software; Circuit faults; Circuit testing; Combinational circuits; Counting circuits; Electrical fault detection; Fault detection; Hardware; Logic design; Logic testing; Binary counter, error detection, integrated circuits, parallel counter, parity generation, parity prediction, self-checking logic.;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/T-C.1972.223518
Filename :
1672111
Link To Document :
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