• DocumentCode
    1110791
  • Title

    Anomalies of refractive-index profiles observed directly in annealed proton-exchanged, X-cut LiTaO3 waveguides

  • Author

    Maring, D.B. ; Tavlykaev, R.F. ; Ramaswamy, R.V.

  • Author_Institution
    Dept. of Electr. Eng., Florida Univ., Gainesville, FL, USA
  • Volume
    32
  • Issue
    16
  • fYear
    1996
  • fDate
    8/1/1996 12:00:00 AM
  • Firstpage
    1473
  • Lastpage
    1474
  • Abstract
    Depth profiles of planar annealed proton-exchanged waveguides in X-cut LiTaO3 are directly measured using a reflectivity technique. Buried extraordinary profiles are confirmed to exist for short annealing times (⩽20 min) and exhibit strong dispersion; these are measured for the first time. The profiles for ordinary polarisation show a substantial index decrease
  • Keywords
    annealing; ion exchange; lithium compounds; optical dispersion; optical fabrication; optical planar waveguides; reflectivity; refractive index; 20 min; LiTaO3; annealing times; buried extraordinary profiles; dispersion; index decrease; planar annealed waveguides; proton-exchanged X-cut waveguides; reflectivity technique; refractive-index profiles;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19960996
  • Filename
    511903
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1110791