DocumentCode :
1110791
Title :
Anomalies of refractive-index profiles observed directly in annealed proton-exchanged, X-cut LiTaO3 waveguides
Author :
Maring, D.B. ; Tavlykaev, R.F. ; Ramaswamy, R.V.
Author_Institution :
Dept. of Electr. Eng., Florida Univ., Gainesville, FL, USA
Volume :
32
Issue :
16
fYear :
1996
fDate :
8/1/1996 12:00:00 AM
Firstpage :
1473
Lastpage :
1474
Abstract :
Depth profiles of planar annealed proton-exchanged waveguides in X-cut LiTaO3 are directly measured using a reflectivity technique. Buried extraordinary profiles are confirmed to exist for short annealing times (⩽20 min) and exhibit strong dispersion; these are measured for the first time. The profiles for ordinary polarisation show a substantial index decrease
Keywords :
annealing; ion exchange; lithium compounds; optical dispersion; optical fabrication; optical planar waveguides; reflectivity; refractive index; 20 min; LiTaO3; annealing times; buried extraordinary profiles; dispersion; index decrease; planar annealed waveguides; proton-exchanged X-cut waveguides; reflectivity technique; refractive-index profiles;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19960996
Filename :
511903
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1110791
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