• DocumentCode
    1110907
  • Title

    IVB-1 tunneling component in polysilicon self-aligned bipolar transistors

  • Author

    Li, G.P. ; Chen, T.C.

  • Volume
    33
  • Issue
    11
  • fYear
    1986
  • fDate
    11/1/1986 12:00:00 AM
  • Firstpage
    1853
  • Lastpage
    1853
  • Keywords
    Bipolar transistors; Circuits; Current measurement; Degradation; Diodes; Electron devices; Leakage current; Process control; Shape measurement; Tunneling;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1986.22798
  • Filename
    1486015