Title :
IVB-5 on-state characteristics of the MOS-controlled thyristor (MCT)
Author :
Temple, V.A.K. ; Pattanayak, Deva N.
fDate :
11/1/1986 12:00:00 AM
Keywords :
FETs; MOSFETs; Radiative recombination; Reflectivity; Silicon; Spontaneous emission; Surface texture; Testing; Thyristors; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1986.22801
