Title :
VB-2 laser-induced photoemission for contactless high-speed IC testing
Author :
Blacha, A. ; Clauberg, R. ; Seitz, H.K. ; Beha, H.
fDate :
11/1/1986 12:00:00 AM
Keywords :
Circuit testing; Electrons; High speed integrated circuits; Integrated circuit testing; Optical pulses; Photoelectricity; Sampling methods; Semiconductor lasers; Spatial resolution; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1986.22812
