Title :
VB-1 photoelectron sampling of waveforms for high-speed testing
Author :
Marcus, R.B. ; Weiner, Andrew M. ; Abeles, J.H. ; Lin, P.S.D.
fDate :
11/1/1986 12:00:00 AM
Keywords :
Circuit testing; Electrons; Gallium arsenide; Geometrical optics; Integrated circuit measurements; Integrated circuit testing; Optical pulse generation; Optical pulses; Pulse measurements; Sampling methods;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1986.22814
