Title :
VB-7 prediction of hot-electron-induced gate currents
Author :
Goldsman, N. ; Frey, Jesse
fDate :
11/1/1986 12:00:00 AM
Keywords :
Boltzmann equation; Charge carrier processes; Current density; Distribution functions; Electrons; MOSFET circuits; Maxwell equations; Temperature; Testing; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1986.22819
