• DocumentCode
    1111534
  • Title

    A general linear-regression analysis applied to the 3-parameter Weibull distribution

  • Author

    Li, Yong-Ming

  • Author_Institution
    Minist. of Electron. Ind., Guangzhou, China
  • Volume
    43
  • Issue
    2
  • fYear
    1994
  • fDate
    6/1/1994 12:00:00 AM
  • Firstpage
    255
  • Lastpage
    263
  • Abstract
    The conventional techniques of linear regression analysis (linear least squares) applied to the 3-parameter Weibull distribution are extended (not modified), and new techniques are developed for the 3-parameter Weibull distribution. The three pragmatic estimation methods in this paper are simple, accurate, flexible, and powerful in dealing with difficult problems such as estimates of the 3 parameters becoming nonpositive. In addition, the inherent disadvantages of the 3-parameter Weibull distribution are revealed; the advantages of a new 3-parameter Weibull-like distribution over the original Weibull distribution are explored; and the potential of a 4-parameter Weibull-like distribution is briefly mentioned. This paper demonstrates how a general linear regression analysis or linear least-squares breaks away from the classical or modern nonlinear regression analysis or nonlinear least-squares. By adding a parameter to the simplest 2-parameter linear regression model (AB-model), two kinds of ABC models (elementary 3-parameter nonlinear regression models) are found, and then a 4-parameter AABC model is built as an example of multi-parameter nonlinear regression models. Although some other techniques are still necessary, additional applications of the ABC models are strongly implied
  • Keywords
    least squares approximations; reliability theory; statistical analysis; 3-parameter Weibull distribution; AABC model; ABC models; linear least-squares analysis; linear regression analysis; multi-parameter nonlinear regression models; pragmatic estimation methods; reliability; Books; Electronics industry; Least squares approximation; Least squares methods; Linear regression; Modems; Regression analysis; Reliability engineering; Reliability theory; Weibull distribution;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.295002
  • Filename
    295002