DocumentCode
1111534
Title
A general linear-regression analysis applied to the 3-parameter Weibull distribution
Author
Li, Yong-Ming
Author_Institution
Minist. of Electron. Ind., Guangzhou, China
Volume
43
Issue
2
fYear
1994
fDate
6/1/1994 12:00:00 AM
Firstpage
255
Lastpage
263
Abstract
The conventional techniques of linear regression analysis (linear least squares) applied to the 3-parameter Weibull distribution are extended (not modified), and new techniques are developed for the 3-parameter Weibull distribution. The three pragmatic estimation methods in this paper are simple, accurate, flexible, and powerful in dealing with difficult problems such as estimates of the 3 parameters becoming nonpositive. In addition, the inherent disadvantages of the 3-parameter Weibull distribution are revealed; the advantages of a new 3-parameter Weibull-like distribution over the original Weibull distribution are explored; and the potential of a 4-parameter Weibull-like distribution is briefly mentioned. This paper demonstrates how a general linear regression analysis or linear least-squares breaks away from the classical or modern nonlinear regression analysis or nonlinear least-squares. By adding a parameter to the simplest 2-parameter linear regression model (AB-model), two kinds of ABC models (elementary 3-parameter nonlinear regression models) are found, and then a 4-parameter AABC model is built as an example of multi-parameter nonlinear regression models. Although some other techniques are still necessary, additional applications of the ABC models are strongly implied
Keywords
least squares approximations; reliability theory; statistical analysis; 3-parameter Weibull distribution; AABC model; ABC models; linear least-squares analysis; linear regression analysis; multi-parameter nonlinear regression models; pragmatic estimation methods; reliability; Books; Electronics industry; Least squares approximation; Least squares methods; Linear regression; Modems; Regression analysis; Reliability engineering; Reliability theory; Weibull distribution;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/24.295002
Filename
295002
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