DocumentCode
1111582
Title
Enhancing Testability of Large-Scale Integrated Circuits via Test Points and Additional Logic
Author
Williams, Michael J Y ; Angell, James B.
Author_Institution
InternationalComputers, Ltd.
Issue
1
fYear
1973
Firstpage
46
Lastpage
60
Abstract
With the increasing complexity of logic that can be fabricated on a single large-scale integrated (LSI) circuit chip, there is a growing problem of checking the logical behavior of the chips at manufacture. The problem is particularly acute for sequential circuits, where there are difficulties in setting and checking the state of the system.
Keywords
Added logic for testability, circuit testing, diagnosis, LSI, test generation, test points.; Application software; Circuit testing; Costs; Integrated circuit testing; Large scale integration; Logic circuits; Logic testing; Sequential circuits; Switches; Switching circuits; Added logic for testability, circuit testing, diagnosis, LSI, test generation, test points.;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/T-C.1973.223600
Filename
1672193
Link To Document