• DocumentCode
    1111595
  • Title

    More goodness-of-fit tests for the power-law process

  • Author

    Park, Won J. ; Seoh, Munsup

  • Author_Institution
    Wright State Univ., Dayton, OH, USA
  • Volume
    43
  • Issue
    2
  • fYear
    1994
  • fDate
    6/1/1994 12:00:00 AM
  • Firstpage
    275
  • Lastpage
    278
  • Abstract
    The power-law process is often used as a model for reliability growth of complex systems or for reliability of repairable systems. There are many results on estimation and hypothesis testing concerning parameters of the power-law process. Goodness-of-fit tests for the power-law process were presented in Park & Kim (1992) using Kolmogorov-Smirnov, Cramer-von Mises, and Anderson-Darling statistics. This paper considers the same problem using three statistics, Kuiper, Watson and weighted Watson. Tables of critical values for the three statistics are presented and the results of a power study are given under the alternative hypothesis that failure data come from a nonhomogeneous Poisson process with log-linear intensity function. The power study shows that the tests have acceptable power for various parameter values and the Cramer-von Mises Statistics, in Park and Kim (1992), has the highest power among the six statistics. An example from the Cox air conditioning repair data is presented
  • Keywords
    failure analysis; large-scale systems; maintenance engineering; reliability; reliability theory; statistical analysis; stochastic processes; Cramer-von Mises Statistics; Kuiper statistics; Watson statistics; complex systems; critical values; failure data; goodness-of-fit tests; log-linear intensity function; model; nonhomogeneous Poisson process; parameter values; power-law process; reliability; reliability growth; repairable systems; weighted Watson statistics; Air conditioning; Art; Maximum likelihood estimation; Power generation; Power system modeling; Power system reliability; Reliability theory; Statistical analysis; Statistics; System testing;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.295010
  • Filename
    295010